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Method to measure the viscosity of nanometer liquid films from the surface fluctuations

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6 Author(s)
Yang, Zhaohui ; Department of Physics, Boston University, Boston, Massachusetts 02215, USA ; Lam, Chi-Hang ; DiMasi, Elaine ; Bouet, Nathalie
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3158956 

We describe a method to measure the viscosity of polystyrene liquid films with thicknesses ∼5 and ∼80 nm spin-cast on oxide-coated silicon. In this method, temporal evolution of the film surface is monitored and modeled according to the dynamics of the surface capillary waves. Viscosities obtained from the ∼80 nm films display an excellent agreement with those of the bulk polymer, but those from the ∼5 nm films are up to 106 times reduced. By modeling the data to the Vogel–Fulcher–Tammann relation, we find that the observations are consistent with the thickness dependence of the glass transition temperature previously reported of these films.

Published in:

Applied Physics Letters  (Volume:94 ,  Issue: 25 )

Date of Publication:

Jun 2009

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