Cart (Loading....) | Create Account
Close category search window
 

Comparison of channel models for Patterned Media Storage

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Gupta, A. ; Dept. of Electron. & Comput. Sci., Indian Inst. of Technol., Roorkee ; Keskinoz, M.

Patterned Media Storage (PMS) is one of the promising technologies to overcome the limitations of the conventional magnetic recording. While advanced signal processing and coding algorithms helps to improve the bit error rate performance of Patterned Media Storage (PMS) channel, they have to be designed by considering the underlying channel model. In literature, there are two popular channel models for PMS: Approximate Model and Analytical Model. In this paper, we first shortly explain these models and then compare their responses by calculating their normalized mean-square error (NMSE) between two models. Through the numerical experiments, we find that NMSE can be substantially high up to 99%. Therefore, we conclude that Approximate Model should not be used to develop signal processing algorithms for PMS.

Published in:

Signal Processing and Communications Applications Conference, 2009. SIU 2009. IEEE 17th

Date of Conference:

9-11 April 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.