Cart (Loading....) | Create Account
Close category search window

Micro-Raman imaging of Te precipitates in CdZnTe (Zn∼4%) crystals

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kulkarni, Gururaj Anand ; Department of Physics, Indian Institute of Science, Bangalore 560012, India ; Sathe, V.G. ; Rao, K.S.R.K. ; Muthu, D.V.S.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Micro-Raman imaging of the distribution of Te precipitates in CdZnTe crystals in different phases is reported. For the normal phase of Te precipitates, the Raman modes appear centered around 121(A1), 141(E)/TO(CdTe) cm-1 and a weak mode around 92(E) cm-1 in CdZnTe indicating the presence of trigonal lattice of Te. Under high pressure phase, the volume of Te precipitates collapses, giving more bond energy resulting in the blueshift of the corresponding Raman bands. Also, the spatial distribution of the area ratio of 121 to 141 cm-1 Raman modes is used to quantify Te precipitates. Further, near-infrared microscopy images support these results.

Published in:

Journal of Applied Physics  (Volume:105 ,  Issue: 6 )

Date of Publication:

Mar 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.