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Influence of the silicon nanocrystal size on the 1.54 μm luminescence of Er-doped SiO/SiO2 multilayers

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3 Author(s)
Rinnert, H. ; Laboratoire de Physique des Matériaux, Nancy-University, CNRS, Boulevard des Aiguillettes, B.P. 239, 54506 Vandœuvre-lès-Nancy, France ; Adeola, G.Wora ; Vergnat, M.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3057386 

The influence of the silicon nanocrystal (Si-nc) size on the erbium luminescence at 1.54 μm was studied in Er-doped silicon oxide thin films containing Si-nc. Er-doped and undoped SiO/SiO2 multilayers were prepared to control the Si-nc size. The results showed that the Er luminescence was due to an energy transfer process between Si-nc and Er ions. The proportion of Si-nc which couples with Er was dependent on the Si-nc size and the energy transfer process is maximal for a size equal to 4 nm. This preferentially coupling effect is interpreted by the existence of an optimum overlap between the Si-nc emission spectrum and the 4I9/2 multiplet of Er ions.

Published in:
Journal of Applied Physics  (Volume:105 ,  Issue: 3 )

Date of Publication: Feb 2009

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