Close category search window
 

Molecular dynamics investigation of interfacial mixing behavior in transition metals (Fe, Co, Ni)-Al multilayer system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lee, Soon-Gun ; Department of Materials Science and Engineering, Hanyang University, Seoul 133-791, South Korea ; Chung, Yong-Chae

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3073899 

The interface and surface structure of transition metal (TM) (Fe, Co, and Ni) thin film deposited on Al(001) substrate at atomic level were investigated by molecular dynamics simulation. In spite of the low adatom incident energy of 0.1 eV, TM-Al intermixing occurred actively at the surface of Al(001) at room temperature. At the interface region of TM/Al(001), an intermetallic compound was formed and found to be of B2 structure. The Co/Al system showed different layer coverage and pair correlation function characteristics, in comparison with Fe/Al and Ni/Al systems. The different structural and intermixing characteristics at the interface were successfully explained in terms of lattice matching, cohesive energy, and local acceleration effect.

Published in:
Journal of Applied Physics  (Volume:105 ,  Issue: 3 )

Date of Publication: Feb 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.