Cart (Loading....) | Create Account
Close category search window

A setup combining magneto-optical Kerr effect and conversion electron Mössbauer spectrometry for analysis of the near-surface magnetic properties of thin films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Juraszek, J. ; CNRS-UMR 6634, Groupe de Physique des Matériaux, Université de Rouen, BP 12, F-76801 Saint Etienne du Rouvray, France ; Zivotsky, O. ; Chiron, H. ; Vaudolon, C.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

We propose a system allowing the characterization of thin magnetic multilayer structures that combine conversion electron Mössbauer spectrometry (CEMS) under applied magnetic field with the magneto-optical Kerr effect (MOKE) technique. Measured hysteresis loops obtained from the MOKE part are used for investigation of sample surface magnetic properties. The CEMS part of such a system is suitable for studying the spatial spin distribution during magnetization reversal under applied magnetic field, whose values are established from the measured MOKE loop. The combined technique is demonstrated on the results obtained at 300 K on an exchange-coupled ferrimagnetic amorphous GdFe/TbFe bilayer, where the center of the GdFe layer is enriched in 57Fe. Both techniques confirm in-plane uniaxial anisotropy. The spin structure at the position of the probe layer is analyzed for several values of the external magnetic field applied in the hard magnetization axis direction.

Published in:

Review of Scientific Instruments  (Volume:80 ,  Issue: 4 )

Date of Publication:

Apr 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.