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Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy

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5 Author(s)
Mitrofanov, O. ; Department of Electronic and Electrical Engineering, University College London, Torrington Place, London WC1E 7JE, United Kingdom ; Tan, Thomas ; Mark, Paul R. ; Bowden, Bradley
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Propagation of terahertz waves in hollow metallic waveguides depends on the waveguide mode. Near-field scanning probe terahertz microscopy is applied to identify the mode structure and composition in dielectric-lined hollow metallic waveguides. Spatial profiles, relative amplitudes, and group velocities of three main waveguide modes are experimentally measured and matched to the HE11, HE12, and TE11 modes. The combination of near-field microscopy with terahertz time-resolved spectroscopy opens the possibility of waveguide mode characterization in the terahertz band.

Published in:

Applied Physics Letters  (Volume:94 ,  Issue: 17 )

Date of Publication:

Apr 2009

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