Cart (Loading....) | Create Account
Close category search window

Characteristics of Resonance Probes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Dote, Toshihiko ; Institute of Physical and Chemical Research, Komagome‐Kamifujimae, Bunkyo‐ku, Tokyo, Japan ; Ichimiya, Torao

Your organization might have access to this article on the publisher's site. To check, click on this link: 

In the last few years there have been several experimental results on resonance probes which were poorly explained by existing theories. They are, briefly: the resonant frequency increases (A) as the bias voltage of the probe is biased strongly negative, and (B) as a probe of smaller area is employed. In this paper, the characteristics of the resonance probe are analyzed on the basis of the resultant series impedance of the plasma and the sheath, the former being expressed by an antiresonant circuit and the latter by a capacitor. According to this mechanism, not only the experimental facts described above, but also all the characteristics of the resonance probe can be interpreted. For example, the dependence of the resonant peak on the bias voltage of the probe and on the input alternating voltage is elucidated. Furthermore, most of these properties are verified by experiments using a mercury plasma.

Published in:

Journal of Applied Physics  (Volume:36 ,  Issue: 6 )

Date of Publication:

Jun 1965

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.