Cart (Loading....) | Create Account
Close category search window

Ion Optics of Fields with Rotational Symmetry and Circular Main Orbit

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Boerboom, A.J.H. ; FOM‐Laboratory for Mass Separation, Kruislaan 407, Amsterdam‐Oost, The Netherlands

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Part I. First-order theory of fields with an axis and a plane of symmetry. By using a symmetry property of the ion orbits in magnetic or electric fields with rotational symmetry, the ion optics inside these fields can be simply deduced. The physical meaning of the various terms in the expressions for the ion orbits is clarified. First-order imaging properties are derived. Part II. First-order theory for the general case. The calculations on the ion optics of fields with an axis and a plane of symmetry are generalized by omitting the requirement of the symmetry plane. The trajectories in the field are calculated up to the second order. The general equation of the ion path is given by

r-R=Σ aklcos[k(αw+[open phi])+l(γw+ψ)]
z=Σ cklcos[k(αw+[open phi])+l(γw+ψ)].
The first-order imaging properties are discussed. Part III. Second-order theory of configurations of consecutive fields and the principle of object aberrations. The method is extended to calculate the ion paths up to the second order in instruments having one or more fields with a plane and an axis of symmetry. By introducing the concept of optical aberrations in the object, the calculation of higher-order aberrations can be simplified to a large extent.

Published in:

Journal of Applied Physics  (Volume:35 ,  Issue: 6 )

Date of Publication:

Jun 1964

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.