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The electrical noise of carefully prepared single‐crystal tellurium samples was measured in the extrinsic temperature range. The effect of temperature variations on the noise power spectrum is interpreted quantitatively as the result of transitions between the valence band and four species of traps lying ∼0.045 eV above it. The additional noise due to steady optical excitation at 77°K is attributed to transverse carrier density gradients which result from nonuniform excitation.