Cart (Loading....) | Create Account
Close category search window
 

Electron Emission in Moderate Accelerating Fields

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Juenker, D.W. ; University of Notre Dame, Notre Dame, Indiana

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1722666 

Investigations of Schottky emission from metals, including some recent work, are summarized and discussed. The following are some of the conclusions: The surface barrier outside a uniform metal surface can be represented accurately by a mirror‐image form for distances greater than about 20 A from the surface. Patch effects can be correlated to some extent with known surface properties. The dependence of photoelectric emission on applied field is in agreement with the Fowler theory adjusted for a Schottky‐type field‐dependent threshold. Periodic deviations from the thermionic Schottky effect are in full agreement with the mirror‐image model for the extra‐surface barrier, and can be used in determining the barrier form in the immediate vicinity of the emitter surface.

Published in:

Journal of Applied Physics  (Volume:28 ,  Issue: 12 )

Date of Publication:

Dec 1957

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.