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A differential built-in current sensor design for high speed IDDQ testing

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2 Author(s)
Hurst, J.P. ; Center for Digital Syst. Res., Res. Triangle Inst., Research Triangle Park, NC, USA ; Singh, A.D.

A new built-in current sensor design for IDDQ testing is presented in this paper. Our design overcomes performance limitations encountered by previous sensors by using a novel differential architecture which allows early and accurate detection of abnormal quiescent current following the switching transient. A test circuit utilizing the sensor in a built-in self-test environment has been fabricated through MOSIS 2.0-micron n-well technology. At clock speeds of up to 31.65 MHz the sensor accurately detects all six of the defects that were implanted in the test chip

Published in:

VLSI Design, 1995., Proceedings of the 8th International Conference on

Date of Conference:

4-7 Jan 1995

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