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Efficient multisine testing of analog circuits

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4 Author(s)
N. Nagi ; LogicVision, San Jose, CA, USA ; A. Chatterjee ; A. Balivada ; J. A. Abraham

An efficient method has been developed for generating test waveforms for linear analog circuits which minimize the test effort and maximize the test confidence. The method makes use of a fault-based automatic test pattern generator (ATPG) to generate a set of test frequencies. A successive gradient method is used to combine these individual sinusoidal signals in a way that maximizes the fault coverage. The compressed waveform can be stored on-chip and used for built-in test of analog circuits

Published in:

VLSI Design, 1995., Proceedings of the 8th International Conference on

Date of Conference:

4-7 Jan 1995