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Generalization of search state equivalence for automatic test pattern generation

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2 Author(s)
Chen, X. ; CAIP Center, Rutgers Univ., Piscataway, NJ, USA ; Bushnell, M.L.

We present a generalization of the equivalent search state (EST) approach for test generation. A search state represents the current search status based on prior search decisions. The generalized EST identifies 56% more previously-searched decision spaces than its predecessor on the 1985 ISCAS benchmarks. We present the enabling theorem with a proof, results and an example for sequential circuit test generation

Published in:

VLSI Design, 1995., Proceedings of the 8th International Conference on

Date of Conference:

4-7 Jan 1995