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A fast algorithm to test planar topological routability

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3 Author(s)
Lim, A. ; Information Technol. Inst., Singapore, Singapore ; Sahni, S. ; Thanvantri, V.

We develop a simple linear time algorithm to determine if a collection of two pin nets can be routed, topologically, in a plane (i.e. single layer). Experiments indicate that this algorithm is faster than the linear time algorithm of Marek-Sadowska and Tarng (1983)

Published in:

VLSI Design, 1995., Proceedings of the 8th International Conference on

Date of Conference:

4-7 Jan 1995