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Proceedings of the 8th International Conference on VLSI Design

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The following topics were dealt with: routing; hardware-software design and CAD; sequential automatic test pattern generation; field programmable gate arrays; high-level synthesis; combinational automatic test pattern generation; logic synthesis and retiming; VLSI arithmetic; decay testing; chip design; image compression; analog circuit test; synthesis and verification; VLSI technology; testability; low-power and analog design; array processor design; diagnosis and self-checking; floorplanning and partitioning; design for testability

Published in:

VLSI Design, 1995., Proceedings of the 8th International Conference on

Date of Conference:

4-7 Jan. 1995