By Topic

Self‐Diffusion in Pure Polycrystalline Silver

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
3 Author(s)
Slifkin, L. ; Department of Physics, University of Illinois, Urbana, Illinois ; Lazarus, D. ; Tomizuka, T.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Self‐diffusion in pure polycrystalline silver has been measured using Ag110 as a tracer. The results of the high temperature experiments, where volume diffusion is predominant, are in excellent agreement with those of other investigators. A least‐squares calculation using all available data on volume diffusion of silver gives as a value for the diffusion coefficient D=0.724e-45, 500/RT. The occurence at low temperatures of grain boundary diffusion, in which the activity decreases exponentially with the first power of the penetration depth, as reported by Hoffman and Turnbull, is confirmed.

Published in:

Journal of Applied Physics  (Volume:23 ,  Issue: 9 )