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Self‐Diffusion in Pure Polycrystalline Silver

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3 Author(s)
Slifkin, L. ; Department of Physics, University of Illinois, Urbana, Illinois ; Lazarus, D. ; Tomizuka, T.

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Self‐diffusion in pure polycrystalline silver has been measured using Ag110 as a tracer. The results of the high temperature experiments, where volume diffusion is predominant, are in excellent agreement with those of other investigators. A least‐squares calculation using all available data on volume diffusion of silver gives as a value for the diffusion coefficient D=0.724e-45, 500/RT. The occurence at low temperatures of grain boundary diffusion, in which the activity decreases exponentially with the first power of the penetration depth, as reported by Hoffman and Turnbull, is confirmed.

Published in:

Journal of Applied Physics  (Volume:23 ,  Issue: 9 )