By Topic

An Active Pixel CMOS separable transform image sensor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)

This paper presents a 128 times 128 charge-mode CMOS imaging sensor that computes separable transforms directly on the focal plane. The pixel is a unique extension of the widely reported active pixel sensor (APS) cell. By capacitively coupling across an array of such cells onto switched capacitor circuits, computation of any unitary 2-D transform that is separable into inner and outer products is possible. This includes the Walsh, Hadamard and Haar basis functions. This scheme offers several advantages including multiresolution imaging, inherent de-noising, compressive sampling and lower integration voltage and faster readout. The chip was implemented on a 0.5 mum CMOS process and measures 9 mm2 in MOSIS' submicron design rules.

Published in:

Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on

Date of Conference:

24-27 May 2009