Cart (Loading....) | Create Account
Close category search window
 

Statistical covariance-matching based blind channel estimation for zero-padding MIMO-OFDM systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chen, Yi-Sheng ; Feng Chia Univ., Taichung, Taiwan ; Jwo-Yuh Wu

We propose a statistical covariance-matching based blind channel estimation scheme for zero-padding (ZP) MIMO-OFDM systems. By exploiting the block Toeplitz channel matrix structure, it is shown that the linear equations relating the entries of the received covariance matrix and the outer product of the MIMO channel matrix taps can be rearranged into a set of decoupled groups. The decoupled nature reduces computations, and more importantly guarantees unique recovery of the channel matrix outer product under a quite mild condition. Then the channel impulse response matrix is identified, up to a Hermitian matrix ambiguity, through an eigen-decomposition of the outer product matrix. Simulation results are used to evidence the advantages of the proposed method over a recently reported subspace algorithm applicable to the ZP-based MIMO-OFDM scheme.

Published in:

Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on

Date of Conference:

24-27 May 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.