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Theory for shot noise in submicron semiconductor diodes using two‐point correlations of noise sources

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2 Author(s)
Chatterjee, A. ; Electrical, Computer, and Systems Engineering Department, Rensselaer Polytechnic Institute, Troy, New York 12181 ; Das, P.

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In this paper the shot noise process is reformulated in terms of spatial correlation functions. In ‘‘ballistic’’ devices local noise sources remain correlated for separation distances on the order of device dimensions. The effect of randomizing collisions, is introduced as a decay of this correlation. The velocity distribution of carriers is taken into account. The effect of parameters such as injection velocity, scattering probability, and device length on noise in near‐ballistic devices could be calculated using this method.

Published in:

Journal of Applied Physics  (Volume:57 ,  Issue: 9 )