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The effect of slight surface roughness on the scattering properties of convex particles

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2 Author(s)
Schiffer, R. ; Institut für Reine und Angewandte Kernphysik der Universität Kiel, Olshausenstr. 40‐60, 2300 Kiel, Federal Republic of Germany ; Thielheim, K.O.

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The average scattering cross section for reflection of electromagnetic waves by an ensemble of randomly oriented convex particles is calculated. The particles are assumed to be large compared to the incident wavelength and to have a slightly rough surface such that the deviations from a smooth surface are smaller than wavelength. A perturbation expansion resulting from the Rayleigh–Rice approach leads to incoherent and coherent corrections to the zero‐order specularly reflected light. The quantity that in this limit completely determines the scattering behavior of the particles is the two‐point correlation function ρ(r) of the roughness structure. The main effect of roughness is a diminution of the reflected intensity for a wide range of the scattering angle θ and a shifting of the maximum of the polarization curve to larger θ. It turns out that measurements of the backscattered intensity in some wavelength limits provide information on the correlation function ρ(r). For conducting material, knowledge of the cross‐polarized backscatter intensity over a wide frequency range even enables one, at least in principle, to calculate the complete shape of the correlation function.

Published in:

Journal of Applied Physics  (Volume:57 ,  Issue: 7 )

Date of Publication:

Apr 1985

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