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Criteria for the ultrasonic measurement of thicknesses by interferometric methods

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5 Author(s)
Houze, M. ; Laboratoire d’Opto‐Acousto‐Electronique (ERA No. 593 C.N.R.S.), Université de Valenciennes, 59326 Valenciennes Cedex, France ; Nongaillard, B. ; Rouvaen, J.M. ; Lefebvre, J.E.
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An ultrasonic interferometer, aimed at the measurement of coating thicknesses and working in a pulsed mode, has been described recently. A new scheme for using this apparatus is proposed here, which applied to the case where a severe acoustic impedance mismatch exists between the measured slice and the surrounding media. Optimal operating conditions for the new scheme and the older one are theoretically discussed and experimentally checked. Owing to the actual impedance mismatch, a choice criterion between the two schemes is then derived.

Published in:

Journal of Applied Physics  (Volume:56 ,  Issue: 3 )