Cart (Loading....) | Create Account
Close category search window

Experimental studies on stabilities of Rutherford cables for superconducting accelerator magnets

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Kim, S.W. ; Nat. Lab. for High Energy Phys., Tsukuba, Japan ; Shintomi, T. ; Kimura, N. ; Makida, Y.
more authors

The stability of a multi-stranded superconducting cable which is used for superconducting accelerators magnets is strongly influenced by the uniformity of steady-state current distribution among strands and smooth transient current sharing among the strands. The controlling factor is the interstrand crossover resistance. A large interstrand crossover resistance will cause non-uniform current distributions and uneven current sharing. In order to investigate stabilities of two kinds of Rutherford cables with different matrix structures and different crossover resistances, we have measured minimum quench energies with the aid of a heater and observed current sharing phenomena. The experimental results were interpreted in terms of interstrand crossover resistance

Published in:

Magnetics, IEEE Transactions on  (Volume:32 ,  Issue: 4 )

Date of Publication:

Jul 1996

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.