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Acoustic microscopy of materials and surface layers

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2 Author(s)
Wilson, R.G. ; Hughes Research Laboratories, Malibu, California 90265 ; Weglein, R.D.

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The application of pulsed reflection acoustic microscopy to the characterization of bulk materials and thin layers of various materials on surfaces is illustrated. The factors that contribute to sharp image contrast, edge definition, and image reversal are delineated and illustrated. Acoustic material signatures of a variety of bulk materials and thin layers of materials on surfaces of a different material are shown. The origin and nature of acoustic material signatures is discussed.

Published in:

Journal of Applied Physics  (Volume:55 ,  Issue: 9 )