By Topic

Acoustic microscopy of materials and surface layers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
2 Author(s)
Wilson, R.G. ; Hughes Research Laboratories, Malibu, California 90265 ; Weglein, R.D.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The application of pulsed reflection acoustic microscopy to the characterization of bulk materials and thin layers of various materials on surfaces is illustrated. The factors that contribute to sharp image contrast, edge definition, and image reversal are delineated and illustrated. Acoustic material signatures of a variety of bulk materials and thin layers of materials on surfaces of a different material are shown. The origin and nature of acoustic material signatures is discussed.

Published in:

Journal of Applied Physics  (Volume:55 ,  Issue: 9 )