Cart (Loading....) | Create Account
Close category search window
 

Measurement of bulk photovoltaic and photorefractive characteristics of iron doped LiNbO3

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Grousson, R. ; Laboratoire d’Optique, Université P. et M. Curie, tour 13, 4 place Jussieu, 75230 Paris Cedex 05, France ; Henry, M. ; Mallick, S. ; Xu, S.L.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.332504 

Birefringence changes induced in LiNbO3:Fe by a light beam have been measured to determine the photovoltaic characteristics such as the saturation value of space charge field, dielectric relaxation time, the probability ϕ of creating a free electron by an absorbed photon and the mean migration length L of the electron. These quantities are determined for different wavelengths covering the region 400–600 nm. The product ϕL that determines the photorefractive sensitivity of the material increases with decreasing wavelength. This increase is largely due to the increase of ϕ, the variation of the migration length being relatively small.

Published in:

Journal of Applied Physics  (Volume:54 ,  Issue: 6 )

Date of Publication:

Jun 1983

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.