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Theory of beam induced current characterization of grain boundaries in polycrystalline solar cells

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1 Author(s)
Donolato, C. ; CNR‐Istituto LAMEL, Via Castagnoli 1, 40126 Bologna, Italy

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.332205 

A theoretical analysis is given of the induced current profiles at grain boundaries in polycrystalline solar cells, as obtained by light or electron beam excitation. The area A and the variance σ2 of the contrast profile of a grain boundary are calculated for realistic generations as functions of the interface recombination velocity vs and the minority carrier diffusion length L. A graphical new procedure is proposed which allows the simultaneous determination of vs and L from the measured values of A and σ. The evaluation of an experimental electron beam induced current profile illustrates the applicability of the theory.

Published in:

Journal of Applied Physics  (Volume:54 ,  Issue: 3 )

Date of Publication:

Mar 1983

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