By Topic

Charging phenomena in the scanning electron microscopy of conductor‐insulator composites: A tool for composite structural analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Chung, K.T. ; RCA Laboratories, Princeton, New Jersey 08540 ; Reisner, J.H. ; Campbell, E.R.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.331946 

Useful applications of charging phenomena occuring during scanning electron microscopy (SEM) of conductor‐insulator composites have been investigated. Unlike the charging of insulating particles in conventional SEM techniques, the local field effect in a conductive composite enhances the relative secondary electron emission in the isolated conductive grains. This ‘‘reverse’’ charging characteristic was utilized for the mapping of dispersion, orientation and segregation characterization in conductor‐insulator composite systems. The charging phenomenon directly reflects the relative electrical continuity of the conductive filler particles in the insulating matrix. The photographic display of the conductive filler arrangement in the composite using this charging phenomenon is termed a SEM charging micrograph. Carbon black/polyvinyl chloride composites with both spherical and chain‐like carbon blacks were used in this study. The structural aspects of such composites as revealed by charge display techniques were found to be directly correlatable with the electrical properties of the composites. This technique is applicable to composites with both small (100 Å) and large (over 10 μ) fillers.

Published in:

Journal of Applied Physics  (Volume:54 ,  Issue: 11 )