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Computer simulated bubble memory longevity experiments

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3 Author(s)
Closson, A. ; Texas Instruments Inc., Dallas, Texas 75265 ; Seitchik, J.A. ; Hsu, J.H.

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A technique for simulating bubble memory longevity experiments is described. The simulation approach is based on comparing the calculated probability of a data error to a pseudorandom number. Both the exponential model and the normal distribution function model of longevity curve behavior are investigated. A theoretical analysis of the exponential model exists, and our simulated results are in agreement with its predictions. The variances of the longevity slope distribution for the normal function model and for the exponential model are found to be the same. It has been possible to find functions which provide a good fit to the simulated results for the normal function model. A simple procedure is presented for comparing the error rates predicted by the two models, and a table of corresponding error rates is presented.

Published in:

Journal of Applied Physics  (Volume:53 ,  Issue: 3 )