By Topic

Computer simulated bubble memory longevity experiments

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Closson, A. ; Texas Instruments Inc., Dallas, Texas 75265 ; Seitchik, J.A. ; Hsu, J.H.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.330677 

A technique for simulating bubble memory longevity experiments is described. The simulation approach is based on comparing the calculated probability of a data error to a pseudorandom number. Both the exponential model and the normal distribution function model of longevity curve behavior are investigated. A theoretical analysis of the exponential model exists, and our simulated results are in agreement with its predictions. The variances of the longevity slope distribution for the normal function model and for the exponential model are found to be the same. It has been possible to find functions which provide a good fit to the simulated results for the normal function model. A simple procedure is presented for comparing the error rates predicted by the two models, and a table of corresponding error rates is presented.

Published in:

Journal of Applied Physics  (Volume:53 ,  Issue: 3 )