By Topic

Voltage Sags: Validating Short-Term Monitoring by Using Long-Term Stochastic Simulation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)

This paper presents a procedure to validate voltage sag results based on a short-term monitoring program and stochastic assessment of voltage sag characteristics. The main practical use of this methodology is to analyze the accuracy of sag characteristics obtained from short monitoring periods. With a Monte Carlo Simulation approach, probabilistic models of several factors are taken into account: lines and busbars fault rate, prefault voltage, fault-type distribution, fault-location uncertainty, and fault resistance distribution. Confidence intervals based on the percentile method and hypothesis tests are the statistical tools selected to perform the validation of voltage sags magnitude and frequency. A case study based on the evaluation of a six-month monitoring period shows the applicability of the proposed methodology.

Published in:

IEEE Transactions on Power Delivery  (Volume:24 ,  Issue: 3 )