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Fault characterization of standard cell libraries using inductive contamination analysis (ICA)

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3 Author(s)
Khare, J. ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Maly, W. ; Tiday, N.

In this paper we demonstrate an Inductive Contamination Analysis (ICA)-based methodology for complete fault characterization of standard cell libraries. Such a characterization has applications in accurate assessment of defect coverage, contamination diagnosis, gate-level delay characterization and test generation

Published in:

VLSI Test Symposium, 1996., Proceedings of 14th

Date of Conference:

28 Apr-1 May 1996