Cart (Loading....) | Create Account
Close category search window
 

An engineering basis for statistical lifetime models with an application to tribology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chick, S.E. ; Michigan Univ., Ann Arbor, MI, USA ; Mendel, M.B.

The authors propose a method for incorporating engineering information about failure mechanisms into a statistical lifetime model. The central idea is that wear, stress, and strain are more directly related to failure than is component age. With an application to tribology, they use the method to derive a lifetime model which explicitly uses information about wear. The model is contrasted with the more common technique of fitting the parameters of a statistical distribution. A primary benefit of an engineering-based model is its interpretability for connecting lifetime data for similar components used under differing operating conditions, such as during accelerated lifetime testing

Published in:

Reliability, IEEE Transactions on  (Volume:45 ,  Issue: 2 )

Date of Publication:

Jun 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.