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Single event effect testing of the Intel 80386 family and the 80486 microprocessor

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8 Author(s)
Moran, A. ; NASA Goddard Space Flight Center, Greenbelt, MD, USA ; LaBel, K. ; Gates, M. ; Seidleck, C.
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We present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored

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Nuclear Science, IEEE Transactions on  (Volume:43 ,  Issue: 3 )