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Browse Journals & Magazines > Nuclear Science, IEEE Transac ...> Volume:43 Issue:3 Help

Single event effect testing of the Intel 80386 family and the 80486 microprocessor

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8 Author(s)
Moran, A. ; NASA Goddard Space Flight Center, Greenbelt, MD, USA ; LaBel, K. ; Gates, M. ; Seidleck, C.
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We present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored

Published in:
Nuclear Science, IEEE Transactions on  (Volume:43 ,  Issue: 3 )

Date of Publication: Jun 1996

Page(s):
879 - 885
ISSN :
0018-9499
INSPEC Accession Number:
5319584
Digital Object Identifier :
10.1109/23.510728
Product Type:
Journals & Magazines
Date of Current Version :
06 August 2002
Issue Date :
Jun 1996
Sponsored by :
IEEE Nuclear and Plasma Sciences Society

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