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L2RFM-local layout realistic faults mapping scheme for analogue integrated circuits

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1 Author(s)
Ohletz, M.J. ; Inst. fur Theor. Elektrotech., Hannover Univ., Germany

A new fault modelling scheme for analogue ICs called Local Layout Realistic Fault Mapping is introduced. It is aimed at realistic fault assumptions prior to the final layout. Defects are assumed and their electrical failure modes are evaluated. It turned out that some faults at schematic level are unrealistic, new types of fault emerge and the distribution of faults changes. For a CMOS operational amplifier the number of faults dropped from 45 to 27

Published in:

Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996

Date of Conference:

5-8 May 1996

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