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Parasitic characterization of radio-frequency (RF) circuits using mixed-mode simulation

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4 Author(s)
Jaejune Jang ; Integrated Circuits Lab., Stanford Univ., CA ; Kan, E.C. ; So, L. ; Dutton, R.W.

Accurate estimation of the parasitics in high-speed circuits is critical in optimizing circuit performance. A new method for parasitic characterization of highspeed circuits employing mixed-mode circuit and device simulation is proposed. The intrinsic characteristics are captured using a device simulator and the equivalent circuit for passive extrinsic elements are evaluated in a straight forward manner from impedance and admittance representation of measured S-parameters. This decoupling enables total performance optimization based on separate tuning of layout and the fabrication process recipe

Published in:

Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996

Date of Conference:

5-8 May 1996