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Geometry dependence of thin‐film transverse thermoelectric voltages

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1 Author(s)
von Gutfeld, R.J. ; IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598

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We have measured the transverse voltage from slant‐angle‐deposited metal films due to laser illumination as a function of film geometry. For a fixed laser spot size, the voltage is found to vary inversely with film width d for d small compared to contact separation a. For d/a ⩾∼1 the voltage approaches a constant. The experimental results are in good agreement with the open‐circuit voltage from a finite‐current dipole and consistent with the thermoelectric model previously proposed. Useful design parameters for transverse thermoelectric optical detectors are implied by the data.

Published in:

Journal of Applied Physics  (Volume:47 ,  Issue: 8 )

Date of Publication:

Aug 1976

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