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Electrical Size Effect of Aluminum Single Crystals

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2 Author(s)
Kirkland, L.R. ; Department of Physics, Clemson University, Clemson, South Carolina 29631 ; Chaplin, R.L.

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The dependence of the residual electrical resistivity on sample size has been measured for four single crystals of high‐purity aluminum. Measurements were made for several thicknesses of each sample by using a chemical polishing solution to reduce the thickness. The theory of Dingle has been adapted in order to analyze the data. Results give good agreement with the Fuchs‐Sondheimer theory of the size effect and give a value for the constant ρbl (bulk resistivity times mean free path) of 7.6×10-12 Ωcm2.

Published in:

Journal of Applied Physics  (Volume:42 ,  Issue: 8 )