Cart (Loading....) | Create Account
Close category search window
 

Photoinjection into SiO2: Electron Scattering in the Image Force Potential Well

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Berglund, C.N. ; Bell Telephone Laboratories, Incorporated, Murray Hill, New Jersey 07974 ; Powell, R.J.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1660066 

The voltage dependence of photoinjected currents in SiO2 films for electric fields less than about 106 V/cm exhibits anomalous behavior. It is shown that the physical mechanism responsible for this behavior is the scattering of photoinjected electrons in the SiO2 image force potential well between the emitter and the potential maximum. A previously published model attributing the effect to electron trapping in SiO2 is shown to be inconsistent with the experimental results. A theoretical model is presented and the voltage dependence of photocurrents is derived including the effects of scattering and barrier lowering. Experimental results from MIS structures using thermally grown SiO2 are found to be in excellent agreement with theoretical predictions when a 34 Å mean free path for scattering in SiO2 is used in the model.

Published in:

Journal of Applied Physics  (Volume:42 ,  Issue: 2 )

Date of Publication:

Feb 1971

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.