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A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test

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3 Author(s)
Wen-Wen Hsieh ; Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu ; I-Sheng Lin ; TingTing Hwang

IR-drop problem during test mode exacerbates delay defects and results in false failures. In this paper, we take the X-filling approach to reduce IR-drop effect during at-speed test. The main difference between our approach and the previous X-filling methods lies in two aspects. The first one is that we take the spatial information into consideration in our approach. The second one is how X-filling is performed. We propose a backward-propagation approach instead of a forward-propagation approach taken in previous work. The experimental results show that we have 42.81% reduction for the worst IR-drop and 45.71% reduction in the average IR-drop as compared to random fill method.

Published in:

Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.

Date of Conference:

20-24 April 2009