Cart (Loading....) | Create Account
Close category search window

Improving compressed test pattern generation for multiple scan chain failure diagnosis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Xun Tang ; Dept. of Electr. & Comput. Eng., Univ. of Iowa, Iowa City, IA ; Ruifeng Guo ; Wu-Tung Cheng ; Reddy, S.M.

To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the errors in responses due to defects which are captured in scan cells are not directly observed. We propose a simple and effective way to enhance the diagnostic resolution achievable by production tests with minimal increase in pattern counts. In this work we present experimental results for the case of multiple scan chain faults to demonstrate the effectiveness of the proposed method.

Published in:

Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.

Date of Conference:

20-24 April 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.