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Both NOR and NAND Embedded Hybrid Flash for S-SIM Application Using 90 nm Process Technology

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16 Author(s)
Jeong-Uk Han ; C&M PA, Samsung Electron. Co., Yongin ; Yong Kyu Lee ; Chang Min Jeon ; Jido Ryu
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We have firstly demonstrated a hybrid flash including both NOR and NAND cell in a single chip using 90 nm logic technology for S-SIM (Super-Subscriber Identity Module) application. The memory sizes are 16 MB NAND and 768 kB NOR flash, respectively. The flash memory cells exhibited over 10 k-cycle endurance and 10-year retention for the successful smart card application.

Published in:

2009 IEEE International Memory Workshop

Date of Conference:

10-14 May 2009