By Topic

A Fine-Grained Parameter Configuration Model for Failure Detection in Overlay Network Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Jijun Cao ; Sch. of Comput., Nat. Univ. of Defense Technol., Changsha ; Jinshu Su ; Yongjun Wang ; Zhigang Sun

Failure detection is a significant challenge in most overlay network systems. And the choice of parameter configuration for a given failure detection scheme has a significant impact on the performance of the scheme. In the traditional coarse-grained parameter configuration (CGPC) model, the parameter configuration for each failure detecting process is uniform. In this paper, we analyze the disadvantages of CGPC model and then propose an alternate model, i.e. the fine-grained parameter configuration (FGPC) model, in which each detecting relationship is allocated with one independently configurable detecting process and the parameter configuration for each failure detecting process can be different. To make a tradeoff between detection time and probability of false positive for parameter configuration policies, we propose a new evaluation criterion, i.e. detection loss. Based on FGPC model, we discuss the two approaches, i.e. common approach and heuristic approach, to choose an optimal parameter configuration policy for failure detection scheme. Finally we show how to apply the FGPC model to a probe-based failure detection scheme in application-layer multicast systems as an example.

Published in:

MultiMedia and Information Technology, 2008. MMIT '08. International Conference on

Date of Conference:

30-31 Dec. 2008