Cart (Loading....) | Create Account
Close category search window
 

Narrow Bloch walls and intrinsic characteristics of the pseudoternary Nd14Fe78-xMnxC8 systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Xing, F. ; Department of Physics, Peking University, Beijing, People’s Republic of China ; Ho, W.W.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.346823 

The lattice constants of Nd14Fe78-xMnxC8 compounds decrease with the increase of Mn context x and have a minimum at about x=14. The Curie temperature Tc decreases linearly and falls off below room temperature beyond x=14. The strong reduction of the saturation magnetization and Tc are attributed to the antiparallel alignment of the Mn and Fe atoms moments. The behavior of magnetization and magnetization reversal in the high‐Mn‐containing samples at low temperature can be interpreted by the narrow domain wall effect. The relationship of the intrinsic coercive force i Hc on temperature agrees well with the exponential formula of the narrow Bloch wall.

Published in:

Journal of Applied Physics  (Volume:68 ,  Issue: 2 )

Date of Publication:

Jul 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.