Cart (Loading....) | Create Account
Close category search window

A two‐layer model to explain the thickness dependence of conductivity and thermoelectric power of semiconductor thin films and application of the model to PbTe thin films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Damodara Das, V. ; Thin Film Laboratory, Department of Physics, Indian Institute of Technology, Madras 600 036, India ; Bhat, K.Seetharama

Your organization might have access to this article on the publisher's site. To check, click on this link: 

A two‐layer model to explain the thickness dependence of conductivity and thermoelectric power of semiconducting thin films has been developed assuming that the film is a parallel combination of resistances of the three layers: The first is the interior ‘‘grain‐boundary’’ layer, and the other two, outer layers on opposite sides, whose conductivities are altered by the band bending (and is also affected by surface‐gas interactions). The equations obtained in this model lead to an inverse thickness dependence of both the conductivity and thermoelectric power of thin films. The model is applied to analyze the conductivity and thermoelectric variation with thickness of PbTe thin films and the parameters Ug, the energy dependence of the ‘‘grain‐boundary’’ mean free path lg, and σg the surface conductivity, have been evaluated.

Published in:

Journal of Applied Physics  (Volume:67 ,  Issue: 8 )

Date of Publication:

Apr 1990

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.