By Topic

Investigation of copper electrodes for mercuric iodide detector applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Bao, X.J. ; Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213 ; Schlesinger, T.E. ; James, R.B. ; Stulen, R.H.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.344560 

Copper diffusion in mercuric iodide was studied by low‐temperature photoluminescence (PL) spectroscopy and Auger electron spectroscopy. A broad radiative emission band at a wavelength of about 6720 Å in the PL spectra was found to be related to Cu incorporation in the crystal. PL spectra obtained from surface doping experiments indicate that Cu is a rapid diffuser in HgI2 bulk material. Auger electron spectroscopy performed as a function of depth from the crystal surface confirms the rapid bulk diffusion process of Cu in HgI2. Fabrication of HgI2 nuclear detectors with Cu electrodes indicates that Cu is not acceptable as an electrode material, which is consistent with the fact that it diffuses easily into the bulk crystal and introduces new radiative recombination centers.

Published in:

Journal of Applied Physics  (Volume:67 ,  Issue: 12 )