Cart (Loading....) | Create Account
Close category search window

Effects of finite radial geometry on free‐electron‐laser instability with a longitudinal wiggler field

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mishra, G. ; Physics Department, Indian Institute of Technology, New Delhi, India, 110016 ; Tripathi, V.K.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The theory of free‐electron‐laser instability for a tenuous relativistic electron beam propagating parallel to a longitudinal wiggler field has been extended to include the influence of finite radial geometry on its stability properties. The growth rate of the instability shows a sensitive dependence on (ν/γ)1/3, where ν is the Budker parameter and γ is the beam energy. The growth rate increases with increasing beam intensity. However, the instability bandwidth with respect to the beam location inside the waveguide decreases for beams with somewhat higher ν/γ values. The instability is broadband for several harmonics excited.

Published in:

Journal of Applied Physics  (Volume:67 ,  Issue: 10 )

Date of Publication:

May 1990

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.