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Structural characterization of molecular‐beam epitaxially grown Zn1-x MnxSe on GaAs(001) substrates

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3 Author(s)
Qadri, S.B. ; U. S. Naval Research Laboratory, Washington, DC 20375 ; Samarth, N. ; Furdyna, J.K.

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Epitaxially grown single‐crystal films of Zn1-xMnxSe have been characterized by x‐ray diffraction techniques. Their dislocation densities have been estimated from double‐crystal rocking‐curve measurements. Values of the unit cell parameters normal and parallel to the substrate surface, as determined from (004) and (444) reflections, indicate that the films have some degree of tetragonal distortion for higher Mn compositions.

Published in:

Journal of Applied Physics  (Volume:66 ,  Issue: 8 )

Date of Publication:

Oct 1989

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