Cart (Loading....) | Create Account
Close category search window

Thermal conductivity of La3-xRxS4 where R=Sm, Eu, and Yb

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Kokos, G.B. ; Ames Laboratory and Department of Materials, Science and Engineering, Iowa State University, Ames, Iowa 50011 ; Gschneidner, K.A. ; Cook, B.A. ; Beaudry, B.J.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The thermal diffusivity values of La2.7Sm0.3S4 , La2.3Sm0.7S4 , La2.7Eu0.3S4 , La2.2Eu0.8S4 , La2.8Yb0.2S4 , and La2.3Yb0.7S4 were measured by the flash diffusivity method from 400 to 1000 °C. The values ranged from 0.007 to 0.018 cm2 /s. The thermal conductivities of the six ternary rare‐earth sulfides were calculated from the thermal diffusivity data and ranged from 10.7 to 31.6 mW/cm °C. Of the alloys measured, La2.2Eu0.8S4 had the highest thermoelectric figure of merit at 1000 °C (0.52×10-3 °C-1). All of the samples had an oxysulfide present at the grain boundaries which degraded their high‐temperature performance.

Published in:

Journal of Applied Physics  (Volume:66 ,  Issue: 6 )

Date of Publication:

Sep 1989

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.