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Previously, it has been shown that thermal stresses may have a significant role to play in optical‐storage media. Calculations have shown that thermal stresses are produced in single‐layer optical‐storage thin films sufficient to cause interlayer failure and blister formation. In this paper, more realistic multilayer thin films are modeled and it is shown that considerably higher stresses can be produced depending on the layer geometry and material properties. These effects are important both in the initial writing process and in subsequent reading or writing processes, and may result in long‐term‐accumulated, stress‐induced damage.