Cart (Loading....) | Create Account
Close category search window
 

The use of fractals for modeling EM waves scattering from rough sea surface

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Chen, J. ; Commun. Res. Lab., McMaster Univ., Hamilton, Ont., Canada ; Lo, T.K.Y. ; Leung, H. ; Litva, J.

A rough surface model based on fractal geometry is presented for the study of surface scattering. In particular, the Pierson-Moskowitz spectrum is incorporated into this model to represent a fully developed sea surface. The Kirchoff approximation is used to evaluate the scattered field from this rough surface. Some interconnection are found between the surface model developed and the statistical characteristics of the scattered field. These include: 1) the relationship between the surface correlation length and the surface fractal dimension; 2) the relationship between the shape parameter of the K-distribution and the surface fractal dimension; 3) the mean value of the scattered amplitude as a function of the surface fractal dimension; and 4) the effect of the incident angle on the scattered field

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:34 ,  Issue: 4 )

Date of Publication:

Jul 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.