Cart (Loading....) | Create Account
Close category search window

Measurement and behavior of dual-polarization vegetation optical depth and single scattering albedo at 1.4- and 5-GHz microwave frequencies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Van de Griend, A.A. ; Inst. of Earth Sci., Vrije Univ., Amsterdam, Netherlands ; Owe, M. ; de Ruiter, J. ; Gouweleeuw, B.T.

A measurement procedure has been developed and tested to determine horizontal and vertical polarization radiative transfer properties, i,e., single scattering albedo (ω) and optical depth (τ), of vegetation under field conditions. The procedure was applied to a wheat crop for a series of biomass densities. The measurements were done using two different radiometers (1.4 and 5 GHz) and for different view angles. The measurements and calculations indicated that the ratios of horizontal and vertical polarization radiative transfer properties (α=Γhν, α'=τhν and β=ωh/ων) are slightly dependent on view angle. However, no significant dependence on biomass density could be discerned

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:34 ,  Issue: 4 )

Date of Publication:

Jul 1996

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.